Author:Hiroyuki Okamura

Publications
Software Test-Run Reliability Modeling with Non-homogeneous Binomial Processes Yunlu Zhao, Tadashi Dohi and Hiroyuki Okamura EasyChair Preprint 767

Keyphrases

goodness-of-fit, non-homogeneous binomial process, Non-homogeneous Poisson process, Poisson Binomial Distribution, prediction, software release decision, software reliability, test-run reliability.