Criticality of Leaf Disease Detection for Better Crop Yield Using Machine Learning Techniques

EasyChair Preprint 5454

Abstract

The crop disease is one of the main problem in agriculture sector which leads huge economic loss and also very big problem for the farmers in the form of low productivity and huge loss for them. The paper which includes the efficient approach to identify the healthy and diseased or infected leaf using image processing and machine learning techniques. The disease which causes the huge damage in the leaf which will be affected for the productivity of crop and that can be detected using image pre-processing, segmentation and classification using machine learning algorithms.

Keyphrases: Classification, Segmentation, image processing, machine learning

@booklet{EasyChair:5454,
  author    = {V M Sindhu and V Ravi Kumar and N Poornima},
  title     = {Criticality of Leaf Disease Detection for Better Crop Yield Using Machine Learning Techniques},
  howpublished = {EasyChair Preprint 5454},
  year      = {EasyChair, 2021}}